An empirical model for the L/sub eff/ dependence of hot-carrier lifetimes of n-channel MOSFETs

✍ Scribed by K. Mistry; B. Doyle

• Book ID: 126631738
• Publisher: IEEE
• Year: 1989
• Tongue: English
• Weight: 250 KB
• Volume: 10
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/55.43116