An electronic speckle pattern interferometer for complete in-plane displacement measurement
โ Scribed by Moore, A J; Tyrer, J R
- Book ID
- 126977982
- Publisher
- Institute of Physics
- Year
- 1990
- Tongue
- English
- Weight
- 911 KB
- Volume
- 1
- Category
- Article
- ISSN
- 0957-0233
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๐ SIMILAR VOLUMES
We describe the construction and operation of a simple electronic speckle pattern interferometer which is sensitive to in-plane motions and rotations. The interferometer is extremely simple and easy to use. It uses a commercial digital still camera for image acquisition, and a personal computer for
A modified two-aperture speckle shear interferometer that eliminates the contribution of the in-plane component and its derivative to the phase change, and yields a fringe pattern corresponding to the first-order partial derivatives of the outof-plane displacement component, is reported in this note