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An electron paramagnetic resonance study of the Si(1 0 0)/Al2O3 interface defects

✍ Scribed by J.L. Cantin; H.J. von Bardeleben

Book ID: 117145744
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 173 KB
Volume: 303
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(02)00981-x

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