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An Atomic Force Microscopy Study of Surface Structures of Colloidal β-FeOOH Particles Forming Smectic Layers

✍ Scribed by Maeda, Hideatsu; Maeda, Yoshiko

Book ID
126129969
Publisher
American Chemical Society
Year
2002
Tongue
English
Weight
1004 KB
Volume
2
Category
Article
ISSN
1530-6984

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Atomic force microscopy in conjunction with the colloid (silica) probe technique has been used to quantify the variations in electrical double-layer interactions and adhesion at different locations on a rough reverse osmosis membrane (AFC99) surface in NaCl solutions. Prior scanning of the membrane