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An apparatus for x-ray film processing

✍ Scribed by V. Ya. Novikov; B. Ya. Mishkinis; É. G. Chikirdin

Publisher
Springer US
Year
1993
Tongue
English
Weight
303 KB
Volume
27
Category
Article
ISSN
0006-3398

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## Abstract An apparatus and a characterization technique have been developed at the ESRF beamline BM5 to investigate in‐situ the evolution of the morphology of a film using grazing incidence X‐ray reflectometry. The instrument is capable of measuring in‐situ and in real time the X‐ray intensity sp