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An apparatus for metallographic studies between 4.2 and 300 K

โœ Scribed by M.V. Zinov'ev; L.K. Kolybaev; V.A. Moskalenko


Publisher
Elsevier Science
Year
1972
Tongue
English
Weight
225 KB
Volume
12
Category
Article
ISSN
0011-2275

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๐Ÿ“œ SIMILAR VOLUMES


An apparatus for measuring internal fric
โœ V.E. Miloshenki; I.V. Zolotukhin; V.S. Postnikov ๐Ÿ“‚ Article ๐Ÿ“… 1973 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 251 KB

We have designed and built an apparatus for measuring internal friction Q-1 (t) and electrical resistance of thin films and foils, of thickness 1 to 200 ~2, in the temperature range from 4.2 to 300 K.

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Graphite crystals with thickness ranging from about 100 to 1500 ,A and were prepared b) cleavage. From measurement of the magnetoresistance and the Hall coefficient the electronic properties were determined by the McClui-e's method. The total carrier density does not change much with thickness. with