An analytical model of SEM and STEM charge collection images of dislocations in thin semiconductor layers. II. EBIC images of dislocations

✍ Scribed by Donolato, C.

• Publisher: John Wiley and Sons
• Year: 1981
• Tongue: English
• Weight: 562 KB
• Volume: 66
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210660205