An analytical model of SEM and STEM charge collection images of dislocations in thin semiconductor layers: I. Minority carrier generation, diffusion, and collection

✍ Scribed by Donolato, C.

• Publisher: John Wiley and Sons
• Year: 1981
• Tongue: English
• Weight: 575 KB
• Volume: 65
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210650231