An analytical method for determining intrinsic drain/source resistance of lightly doped drain (LDD) devices

✍ Scribed by Charvaka Duvvury; Dave Baglee; Michael Duane; Adin Hyslop; Michael Smayling; Mike Maekawa

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 549 KB
• Volume: 27
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(84)90097-2