An analytical method for determining intrinsic drain/source resistance of lightly doped drain (LDD) devices : Charvaka Duvvury, Dave Baglee, Michael Duane, Adin Hyslop, Michael Smayling and Mike Maekawa. Solid-St. Electron.27 (1), 89 (1984)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 134 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90382-2