An analytical delayed-turn-off model for buried-channel PMOS devices operating at 77 K

✍ Scribed by Jai-Hoon Sim; Kuo, J.B.

• Book ID: 114534560
• Publisher: IEEE
• Year: 1992
• Tongue: English
• Weight: 720 KB
• Volume: 39
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.127486