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An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices

✍ Scribed by Renan Doria Trevisoli; João Antonio Martino; Eddy Simoen; Cor Claeys; Marcelo Antonio Pavanello

Book ID: 113800619
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 881 KB
Volume: 52
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2011.10.007

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