๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

An analysis of microstrip with rectangular and trapezoidal conductor cross sections

โœ Scribed by Railton, C.J.; McGeehan, J.P.


Book ID
114552908
Publisher
IEEE
Year
1990
Tongue
English
Weight
480 KB
Volume
38
Category
Article
ISSN
0018-9480

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Skin-effect resistance of conductors wit
โœ J. Guo; A. W. Glisson; D. Kajfez ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 102 KB

Figure 3 Inverse quality factor calculated using the FDTD program as a function of the device radius optical model is able to analyze complex VCSEL structures, and to generate the eigenfrequencies, power spectra, spatial distribution, and quality factor of the cavity modes. The key issues for the d