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An analogue test technique for massively parallel integrated circuits and systems: An approach to neural networks circuits testing

✍ Scribed by Kurosh Madani

Book ID: 112966919
Publisher: Springer-Verlag
Year: 1993
Tongue: English
Weight: 934 KB
Volume: 48
Category: Article
ISSN: 0003-4347
DOI: 10.1007/bf02995489

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