Selecting test methodologies for PLAs and random logic modules in VLSI circuits — an expert systems approach

✍ Scribed by Sudipta Bhawmik; V.K. Narang; Parimal Pal Chaudhuri

• Book ID: 107920160
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 754 KB
• Volume: 7
• Category: Article
• ISSN: 0167-9260
• DOI: 10.1016/0167-9260(89)90005-9