An accurate intrinsic capacitance modeling for deep submicrometer MOSFET's

✍ Scribed by Cho, D.-H.; Kang, S.-M.; Kim, K.-H.; Lee, S.-H.

• Book ID: 114535988
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 841 KB
• Volume: 42
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.368052