𝔖 Bobbio Scriptorium
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An efficient and accurate compact model for thin-oxide-MOSFET intrinsic capacitance considering the finite charge layer thickness

✍ Scribed by Liu, W.; Jin, X.; King, Y.; Hu, C.


Book ID
114537728
Publisher
IEEE
Year
1999
Tongue
English
Weight
130 KB
Volume
46
Category
Article
ISSN
0018-9383

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