Amplitude-Dependent Internal Friction in Silicon Bronze at Low Temperatures
β Scribed by Pilecki, S. ;Ivanov, V. I. ;Lebedev, A. B.
- Publisher
- John Wiley and Sons
- Year
- 1990
- Tongue
- English
- Weight
- 328 KB
- Volume
- 119
- Category
- Article
- ISSN
- 0031-8965
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We measured the low temperature internal friction of a variety of hydrogenated amorphous, nanocrystalline, polycrystalline, and epitaxial silicon thin films. Most of the films studied are prepared either by hot-wire chemical-vapor deposition (HWCVD) or by plasma-enhanced chemical-vapor deposition (P
Internal frictions of several polycrystalline copper wires of various purities deformed at liquid nitrogen temperature and at room temperature were measured as a function of temperature between -190Β°C and + 20Β°C at about 1 c/s. There are three relaxation peaks in this temperature region and detailed