๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Amorphous Silicon-Insulator Interface Studies

โœ Scribed by Chan, Y. K. ;Jayadevaiah, T. S.


Book ID
105370231
Publisher
John Wiley and Sons
Year
1974
Tongue
English
Weight
160 KB
Volume
24
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Bonding at silicon/insulator interfaces
โœ F.J. Himpsel; T.F. Heinz; A.B. McLean; E. Palange ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 540 KB
Polarizability Studies of Amorphous Sili
โœ N. M. Ravindra; J. F. Morhange; P. A. Thomas; C. Ance ๐Ÿ“‚ Article ๐Ÿ“… 1984 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 530 KB
Interface coupling effects in thin silic
โœ T. Ouisse; S. Cristoloveanu; T. Elewa; B. Boukriss; A. Chovet ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 526 KB

Several experiments converge to demonstrate the strong variation of the front channel properties with the substrate bias in thin film SOI-MOS structures. A model is proposed 'to explain the deformation of the transconductance shape and the variation of its maximum. A related second order effect cons