๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

American society for testing and materials. Standard guide for depth profiling in auger electron spectroscopy (E1127-91)

Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
444 KB
Volume
17
Category
Article
ISSN
0142-2421

No coin nor oath required. For personal study only.

โœฆ Synopsis

Abstract

This standard is issued under the fixed designation E1127; the number immediately following the designation indicates the year of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscript epsilon (ฮต) indicates an editorial change since the last revision or reapproval.

๐Ÿ“œ SIMILAR VOLUMES

American society for testing and materia
American society for testing and materials. Standard guide for background subtraction techniques in Auger electron spectroscopy (E995-89)
๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 280 KB

## Abstract This standard is issued under the fixed designation E995; the number immediately following the designation indicates the year of original adoption or, in the case or revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscript epsilon

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American society for testing and materials. Standard guide for minimizing unwanted electron beam effects in Auger electron spectroscopy (E983-89)
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## Abstract This standard is issued under the fixed designation E983; the number immediately following the designation indicates the year of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscript epsilon

American society for testing and materia
American society for testing and materials. Standard practice for reporting data in Auger electron spectroscopy (E996-89)
๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 226 KB

## Abstract This standard is issued under the fixed designation E996; the number immediately following the designation indicates the year of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscript epsilon

American society for testing and materia
American society for testing and materials. Standard guide for specimen handling in Auger electron spectroscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry (E1078-90)
๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 883 KB

## Abstract This standard is issued under the fixed designation E1078; the number immediately following the designation indicates the year of original adoption or, in case of revision, the year of last revision. A number in parenthese indicates the year of last reapproval. A superscript epsilon (ฮต)