✦ LIBER ✦

American society for testing and materials standard practice for reporting sputter depth profile data in secondary ion mass spectrometry (SIMS) (e1162-87)

Publisher: John Wiley and Sons
Year: 1989
Tongue: English
Weight: 241 KB
Volume: 14
Category: Article
ISSN: 0142-2421
DOI: 10.1002/sia.740140622

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

American society for testing and materia

American society for testing and materials. Standard practice for reporting data in Auger electron spectroscopy (E996-89)

📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 226 KB

## Abstract This standard is issued under the fixed designation E996; the number immediately following the designation indicates the year of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscript epsilon

American society for testing and materia

American society for testing and materials. Standard guide for specimen handling in Auger electron spectroscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry (E1078-90)

📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 883 KB

## Abstract This standard is issued under the fixed designation E1078; the number immediately following the designation indicates the year of original adoption or, in case of revision, the year of last revision. A number in parenthese indicates the year of last reapproval. A superscript epsilon (ε)