Aluminum metallization—Advantages and limitations for integrated circuit applications : G. L. Schnable and R. S. Keen, Proc. IEEE57, September (1969), p. 1570

• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 110 KB
• Volume: 9
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(70)90405-1