✦ LIBER ✦
Failure mechanisms in large-scale integrated circuits : G. L Schnable and R. S. Keen, IEEE Trans. ED-16, No. 4, April (1969), p. 322
- Publisher
- Elsevier Science
- Year
- 1970
- Tongue
- English
- Weight
- 98 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0026-2714
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