Aluminum cluster ions and aluminum-xenon complex ions formed by ion sputtering

✍ Scribed by Yahachi Saito; Itsuo Katakuse; Hiroyuki Ito

• Book ID: 103025790
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 586 KB
• Volume: 161
• Category: Article
• ISSN: 0009-2614
• DOI: 10.1016/0009-2614(89)85094-8

✦ Synopsis

Bare aluminum cluster ions Al.+ (n 5 90) and aluminum-xenon complex ions Xe,_ ,Al+ (k$24) produced by 7 keV Xe ion bombardment of an Al target have been analyzed using a sector-type mass spectrometer. The abundance spectra of Al: show intensity anomalies correlating with the electronic shell model for a small size region n 5 25; however, for larger clusters the spectra show only monotonic decrease with size. The aluminum-xenon complex ions are detected when the dosage of Xe ions exceeds about lOrg ions/cm*. The binding energy and formation mechanism of Xek_ ,Al+ are also discussed.