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Allowing for current spreading in semiconductors during measurements of the contact resistivity of ohmic contacts

โœ Scribed by A. N. Andreev; M. G. Rastegaeva; V. P. Rastegaev; S. A. Reshanov


Book ID
110119874
Publisher
Springer
Year
1998
Tongue
English
Weight
132 KB
Volume
32
Category
Article
ISSN
1063-7826

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