Measurement of Semiconductor Laser Gain by the Segmented Contact Method Under Strong Current Spreading Conditions

✍ Scribed by Suchalkin, S.; Westerfeld, D.; Belenky, G.; Bruno, J.D.; Pham, J.; Towner, F.; Tober, R.L.

• Book ID: 117883518
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 436 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9197
• DOI: 10.1109/jqe.2008.917972