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Algorithms for Reflecting Rays from General Topographic Surfaces in a Ray Tracing Program

โœ Scribed by Jones, R. M.


Book ID
120233591
Publisher
American Institute of Physics
Year
1983
Tongue
English
Weight
226 KB
Volume
74
Category
Article
ISSN
0001-4966

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## Total Reflection X-ray Fluorescence (TXRF) is a variant of Energy dispersive X-ray Fluorescence (EDXRF). It is a comparatively new method of trace element analysis and finds its application in various research areas of material development and processing. The versatility of TXRF is due to (i.) r