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AlGaN/GaN-on-Silicon Metal–Oxide–Semiconductor High-Electron-Mobility Transistor with Breakdown Voltage of 800 V and On-State Resistance of 3 m$\Omega$$\cdot$cm$^{2}$ Using a Complementary Metal–Oxide–Semiconductor Compatible Gold-Free Process

✍ Scribed by Liu, Xinke; Zhan, Chunlei; Chan, Kwok Wai; Liu, Wei; Tan, Leng Seow; Chen, Kevin Jing; Yeo, Yee-Chia


Book ID
121863023
Publisher
Institute of Pure and Applied Physics
Year
2012
Tongue
English
Weight
858 KB
Volume
5
Category
Article
ISSN
1882-0778

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