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ALD and MOCVD of Ga2O3 Thin Films Using the New Ga Precursor Dimethylgallium Isopropoxide, Me2GaOiPr

✍ Scribed by Heeju Lee; Kunhee Kim; Jeong-Jun Woo; Doo-Jin Jun; Youngsoo Park; Yunsoo Kim; Hong Won Lee; Yong Jai Cho; Hyun Mo Cho


Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
339 KB
Volume
17
Category
Article
ISSN
0948-1907

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A new alkoxide precursor, Hf(mp) 4 [mp = 3-methyl-3-pentoxide, OC(CH 3 )(C 2 H 5 ) 2 ] has been employed in the atomic layer deposition (ALD) of HfO 2 thin films using water (H 2 O) as the oxygen source. The self-limiting ALD process via alternate surface reactions of Hf(mp) 4 and H 2 O is confirmed