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Aging characteristics of tantalum nitride thin film resistors : J. S. Fisher, 1968 Electron. Compon. Conf., May 8–10 (1968), Proceedings, p. 299

Publisher: Elsevier Science
Year: 1969
Tongue: English
Weight: 29 KB
Volume: 8
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(69)90042-0

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