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The reliability of screened metal film resistors : J. P. Mahner, D. P. Burks, W. G. Seeley and H. Geller, 1968 Electron. Compon. Conf., May 8–10 (1968), Proceedings, p. 271


Publisher
Elsevier Science
Year
1969
Tongue
English
Weight
90 KB
Volume
8
Category
Article
ISSN
0026-2714

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