𝔖 Bobbio Scriptorium
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AFM and XPS study of ion bombarded poly(methyl methacrylate)

✍ Scribed by B. Pignataro; M.E. Fragalà; O. Puglisi


Book ID
114169305
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
605 KB
Volume
131
Category
Article
ISSN
0168-583X

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## Abstract The microstructure of a series of injection‐molded and extruded rubber–toughened poly(methyl methacrylate) (RTPMMA) samples was investigated. Atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) were used to study surface topography and local elastic properties. AFM topog