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AFM and X-ray studies of films formed by thermal evaporation and by the LB technique

✍ Scribed by Z. Ali-Adib; P. Hodge; R.H. Tredgold; M. Woolley; A.J. Pidduck


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
488 KB
Volume
242
Category
Article
ISSN
0040-6090

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We applied grazing incidence x-ray specular and non-specular reΓ‘ectivity (GIXR) and small-angle x-ray scattering (SAXS) to study the surface roughness of gold Ðlms on quartz glass substrates. Two model systems were prepared : one series of Au Ðlms was sputtered in Ar at 3 Γ‚ 10-3mbar (Au1 Ðlms) and o