𝔖 Bobbio Scriptorium
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AES analysis of failures in Cu based electromigration test samples

✍ Scribed by S. Baunack; T.G. Kötter; H. Wendrock; K. Wetzig


Book ID
108417470
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
333 KB
Volume
179
Category
Article
ISSN
0169-4332

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## Abstract We propose a new approach for the analysis of copy number variants (CNVs)for genome‐wide association studies in family‐based designs. Our new overall association test combines the between‐family component and the within‐family component of the family‐based data so that the new test stat