๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Advantages of photon scanning tunneling microscope combined with atomic force microscope

โœ Scribed by Jian Zhang; Yinli Li; Gaoshu Jian; Ping Zhou; Shifa Wu

Book ID
115367455
Publisher
Optics InfoBase
Year
2005
Tongue
English
Weight
547 KB
Volume
3
Category
Article
ISSN
1671-7694

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Tapping mode atomic force microscope com
Tapping mode atomic force microscope combined with reflection scanning near-field optical microscope (AF/RSNOM)
โœ Yinli Li; Shifa Wu; Pengfei Li; Jian Zhang; Shi Pan ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 204 KB

A new kind of scanning probe microscope is introduced in this paper, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) with equi-amplitude tapping mode. The principle and recent experiment result of AF/RSNOM are reported. Besides conve