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[Advances in Imaging and Electron Physics] Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy Volume 153 || Future Contributions

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Book ID: 120734066
Publisher: Elsevier
Year: 2008
Weight: 36 KB
Category: Article
ISBN: 012374220X
DOI: 10.1016/S1076-5670(09)70020-5

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