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[Advances in Imaging and Electron Physics] Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy Volume 153 || Contributors

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Book ID: 120734064
Publisher: Elsevier
Year: 2008
Weight: 33 KB
Category: Article
ISBN: 012374220X
DOI: 10.1016/S1076-5670(09)70018-7

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