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Adhesive strength of CVD diamond thin films quantitatively measured by means of the bulge and blister test

✍ Scribed by Daohui Xiang; Ming Chen; Yuping Ma; Fanghong Sun

Book ID: 117695511
Publisher: Chinese Electronic Periodical Services
Year: 2008
Tongue: English
Weight: 598 KB
Volume: 15
Category: Article
ISSN: 1005-8850
DOI: 10.1016/s1005-8850(08)60089-4

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