## Abstract A Monte Carlo simulation, a nonโlinear fitting routine, and an uncertainty extraction routine are used to analyze the uncertainty of a commercial microwave noise temperature measurement system. Measured data for an __S__/__C__ band synthetic FETโbased cold load, two microwave solidโstat
โฆ LIBER โฆ
Activity measurement of a 176Lu sample using coincidence peaks and Monte Carlo simulations
โ Scribed by C. Jutier; G. Le Petit
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 189 KB
- Volume
- 64
- Category
- Article
- ISSN
- 0969-8043
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