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Activation energy for electrotransport in thin aluminum films by resistance measurements

✍ Scribed by R.E. Hummel; R.T. DeHoff; H.J. Geier

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 340 KB
Volume: 17
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(75)90511-6

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