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Activation energy for electrotransport in thin aluminum films by resistance measurements

✍ Scribed by R.E. Hummel; R.T. Dehoff; H.J. Geier

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 816 KB
Volume: 37
Category: Article
ISSN: 0022-3697
DOI: 10.1016/0022-3697(76)90183-9

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