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[ACM Press the 39th conference - New Orleans, Louisiana, USA (2002.06.10-2002.06.14)] Proceedings of the 39th conference on Design automation - DAC '02 - Enhancing test efficiency for delay fault testing using multiple-clocked schemes

✍ Scribed by Liou, Jing-Jia; Wang, Li-C.; Cheng, Kwang-Ting; Dworak, Jennifer; Mercer, M. Ray; Kapur, Rohit; Williams, Thomas W.

Book ID
121007538
Publisher
ACM Press
Year
2002
Tongue
English
Weight
106 KB
Category
Article
ISBN-13
9781581134612
ISSN
0738-100X

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✦ Synopsis

Sponsored By Acm ... [et Al.]. Cover Title. Acm Order Number 477020 ; Ieee Catalog Number 02ch37324--t.p. Verso. Includes Bibliographical References And Author Index. Also Available On The World Wide Web Via Acm Digital Library With Title: Proceedings Of The 39th Conference On Design Automation, 20002 And Via Ieee Xplore With Title: Design Automation Conference, 2002, Proceedings, 39th.

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