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[ACM Press the 39th conference - New Orleans, Louisiana, USA (2002.06.10-2002.06.14)] Proceedings of the 39th conference on Design automation - DAC '02 - A novel wavelet transform based transient current analysis for fault detection and localization

✍ Scribed by Bhunia, Swarup; Roy, Kaushik; Segura, Jaume

Book ID
115535232
Publisher
ACM Press
Year
2002
Tongue
English
Weight
202 KB
Volume
0
Category
Article
ISBN-13
9781581134612
ISSN
0738-100X

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✦ Synopsis

Sponsored By Acm ... [et Al.]. Cover Title. Acm Order Number 477020 ; Ieee Catalog Number 02ch37324--t.p. Verso. Includes Bibliographical References And Author Index. Also Available On The World Wide Web Via Acm Digital Library With Title: Proceedings Of The 39th Conference On Design Automation, 20002 And Via Ieee Xplore With Title: Design Automation Conference, 2002, Proceedings, 39th.

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