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[ACM Press the 32nd ACM/IEEE conference - San Francisco, California, United States (1995.06.12-1995.06.16)] Proceedings of the 32nd ACM/IEEE conference on Design automation conference - DAC '95 - Test program generation for functional verification of PowerPC processors in IBM

✍ Scribed by Aharon, Aharon; Goodman, Dave; Levinger, Moshe; Lichtenstein, Yossi; Malka, Yossi; Metzger, Charlotte; Molcho, Moshe; Shurek, Gil


Book ID
120916099
Publisher
ACM Press
Year
1995
Weight
77 KB
Category
Article
ISBN-13
9780897917254

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