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[ACM Press the 28th conference - San Francisco, California, United States (1991.06.17-1991.06.22)] Proceedings of the 28th conference on ACM/IEEE design automation conference - DAC '91 - Transition density, a stochastic measure of activity in digital circuits

✍ Scribed by Najm, Farid N.

Book ID: 125857599
Publisher: ACM Press
Year: 1991
Weight: 608 KB
Category: Article
ISBN-13: 9780897913959
DOI: 10.1145/127601.127744

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