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[ACM Press the 2014 international symposium - La Jolla, California, USA (2014.08.11-2014.08.13)] Proceedings of the 2014 international symposium on Low power electronics and design - ISLPED '14 - A digital dynamic write margin sensor for low power read/write operations in 28nm SRAM

โœ Scribed by Beshay, Peter; Chandra, Vikas; Aitken, Rob; Calhoun, Benton H.


Book ID
125842960
Publisher
ACM Press
Year
2014
Weight
316 KB
Category
Article
ISBN
1450329756

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[ACM Press Proceeding of the thirteenth
โœ Wang, Jiajing; Nalam, Satyanand; Calhoun, Benton H. ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› ACM Press โš– 469 KB

This paper analyzes write ability for SRAM cells in deeply scaled technologies, focusing on the relationship between static and dynamic write margin metrics. Reliability has become a major concern for SRAM designs in modern technologies. Both local mismatch and scaled V DD degrade read stability and