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[ACM Press Proceeding of the thirteenth international symposium - Bangalore, India (2008.08.11-2008.08.13)] Proceeding of the thirteenth international symposium on Low power electronics and design - ISLPED '08 - Optimal technology selection for minimizing energy and variability in low voltage applications

โœ Scribed by Seok, Mingoo; Sylvester, Dennis; Blaauw, David

Book ID
120014379
Publisher
ACM Press
Year
2008
Weight
302 KB
Category
Article
ISBN
1605581097

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[ACM Press Proceeding of the thirteenth
[ACM Press Proceeding of the thirteenth international symposium - Bangalore, India (2008.08.11-2008.08.13)] Proceeding of the thirteenth international symposium on Low power electronics and design - ISLPED '08 - Analyzing static and dynamic write margin for nanometer SRAMs
โœ Wang, Jiajing; Nalam, Satyanand; Calhoun, Benton H. ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› ACM Press โš– 469 KB

This paper analyzes write ability for SRAM cells in deeply scaled technologies, focusing on the relationship between static and dynamic write margin metrics. Reliability has become a major concern for SRAM designs in modern technologies. Both local mismatch and scaled V DD degrade read stability and