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Accurate time delay determination for femtosecond X-ray diffraction experiments

✍ Scribed by C. von Korff Schmising; M. Bargheer; M. Kiel; N. Zhavoronkov; M. Woerner; T. Elsaesser; I. Vrejoiu; D. Hesse; M. Alexe

Publisher: Springer
Year: 2007
Tongue: English
Weight: 318 KB
Volume: 88
Category: Article
ISSN: 0721-7269
DOI: 10.1007/s00340-007-2678-7

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## Abstract We describe a rapid digital system for X‐ray diffraction imaging and demonstrate its application to the real‐time identification of edge defects in a silicon wafer that had been subjected to rapid thermal annealing. The application of the system to the __in situ__ study of slip nucleati