Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements

✍ Scribed by Young, P.R.; McPherson, D.S.; Chrisostomidis, C.; Elgaid, K.; Thayne, I.G.; Lucyszyn, S.; Robertson, I.D.

• Book ID: 114455122
• Publisher: The Institution of Electrical Engineers
• Year: 2001
• Tongue: English
• Weight: 392 KB
• Volume: 148
• Category: Article
• ISSN: 1350-2417
• DOI: 10.1049/ip-map:20010402