Accurate estimation of statistical parametric variation in microelectronic test structures

✍ Scribed by Mahesh Kumar; Shobha Gupta

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 146 KB
• Volume: 27
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(87)90475-6